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ED-XRF (Energy Dispersive X Ray Fluorescence)

• No liquid nitrogen required (low operating cost)

• Elements that can be detected ranges from Sulphur to Uranium

• Compatible to Rohs, ELV & WEEE directive

• Able to check for halogen (Cl & Br)

• Large chamber for various sample type and size

• Optional sample changer (can check up to 12 parts)

• Measurement report can be printed in Word or Excel

• Optional High Speed software (can reduce checking timing)

• Able to operate from AC100V to AC240V

• No liquid nitrogen required for high count rate Vortex detector
• Able to check for light elements, measure range extend to Sodium to Uranium when using vacuum atmosphere
• Compatible to Rohs, ELV & WEEE directive
• Able to check for halogen (Cl & Br)
• Able to check for light elements
• Large chamber for various sample type and size
• Optional sample changer (can check up to 12 parts)
• Measurement report can be printed in Word or Excel
• Optional High Speed software (can reduce checking timing)
• Able to operate from AC100V to AC240V

• No liquid nitrogen required for high count rate Vortex detector
• Light element measurement
• Compatible to Rohs, ELV & WEEE directive
• Able to check for halogen (Cl & Br)
• Coating thickness measurement
• High speed mapping
• Contaminant Analysis
• Continuous multi-point measurements
• Measurement report can be printed in Word or Excel
• Optional High Speed software (can reduce checking timing)
• Able to operate from AC100V to AC240V

X Ray Coating Thickness Gauge

• 50nm Au plating thickness can be measured precisely in 10 seconds
• Easy positioning by Wide View System (optional)

• Successor to the SFT 3000 series
• Incident lighting makes samples easier to view
• Collision prevention sensor makes contoured samples safe to use
• Easy focus operation with the laser focus mechanism
• Easy to observe microscopic areas, equipped with four-step zoom (option)
• Focus distance toggle mechanism enables measurement of low area in a sample with height
   

• 75W high power X-ray provides more accurate measurement result and shorter measurement time
• 15µm collimator for smaller measurement area
• Zoom optic system for better positioning accuracy
• Laser focus aid - Measure from atom No 22(Ti) to 83(Bi)
• Spectrum matching for material determination
• Bulk calibration for plating liquid measurement

• Has Dual Detector - capable of measuring ultra thin Au film less than 0.01 um
• Measurement of Microscopic Area
• High Power X-ray Tube (equipped with 75 W high powered X ray tube)
• Observation of Microscopic Areas (equipped with 4 step zoom)
• Large stage (SFT9455 model)
• Incident lighting makes samples easier to view
• Collision prevention sensor makes contoured samples safe to use
• High-accuracy stage drive train powered by servomotor
• Accurate Focus
• Measurement sample can be focused accurately by laser with one touch of the button.

• X-ray Capillary System provides fluorescent X-ray intensity 10 times that of conventional methods
• High Resolution Liquid Nitrogen Free Semiconductor Detector
• Laser focus aid - Measure from atom No.13(Al) to 83(Bi)
• Spectrum matching for material determination
• RoHS & WEEE directive compliance for Hazardous Substance monitoring
• Multilayered Ultra Thin Film coating thickness measurement

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